Application Examples
- DC voltage/current reference, pulse voltage/current source
- V-I curve trace, semiconductor parametric test
- Programmable arbitrary waveform generation
- Electric load, resistance measurement
- Production test
Twice the channel count, double the possibilities
The GS820 source measure unit features dual source/measure channels, enhanced signal resolution, and data storage to handle a multitude of applications from FET testing to effiency characterizaiton, all in a sngle, compact, unit.
Dual I/O Channels
- Operate the device in all four quadrants on TWO channels
- Generate endless combinations of test scenarios
Ease of Setup
- Utilize dedicated I/V curve tracing software or quickly and easily generate customized test setup files
- Quickly and efficiently create complex pwm, step, ramp, and logarithmic waveforms
Limitless Possibilities
- Test and characterize anything from multiple FETS and switches to efficency on DC-DC converters
Brochure
[wpdm_package id=’4465′]
